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Schottky barrier characteristics of Pt contacts to all sputtering-maden-type GaN and MOS diodes
Tuan, Thi Tran Anh, Kuo, Dong-Hau, Li, Cheng-Che, Yen, Wei-ChunVolume:
25
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-014-2012-1
Date:
August, 2014
File:
PDF, 923 KB
english, 2014