Analyzing technology impact networks for R&D planning using patents: combined application of network approaches
Ko, Sung-Seok, Ko, Namuk, Kim, Doyeon, Park, Hyunseok, Yoon, JanghyeokVolume:
101
Language:
english
Journal:
Scientometrics
DOI:
10.1007/s11192-014-1343-2
Date:
October, 2014
File:
PDF, 1.36 MB
english, 2014