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The Assessment of Interface Adhesion of Cu/Ta/Black Diamond™/Si Films Stack Structure by Nanoindentation and Nanoscratch Tests
Liao, Chenglong, Guo, Dan, Wen, Shizhu, Lu, Xinchun, Pan, Guoshun, Luo, JianbinVolume:
53
Language:
english
Journal:
Tribology Letters
DOI:
10.1007/s11249-013-0279-7
Date:
February, 2014
File:
PDF, 1012 KB
english, 2014