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A data-driven threshold for wavelet sliding window denoising in mechanical fault detection
Chen, YiMin, Zi, YanYang, Cao, HongRui, He, ZhengJia, Sun, HaiLiangVolume:
57
Language:
english
Journal:
Science China Technological Sciences
DOI:
10.1007/s11431-013-5451-7
Date:
March, 2014
File:
PDF, 883 KB
english, 2014