Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology
Qiao, FengYing, Pan, LiYang, Yu, Xiao, Ma, HaoZhi, Wu, Dong, Xu, JunVolume:
57
Language:
english
Journal:
Science China Information Sciences
DOI:
10.1007/s11432-013-4982-7
Date:
June, 2014
File:
PDF, 567 KB
english, 2014