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Defects Study in HgxCd1−xTe Infrared Photodetectors by Deep Level Transient Spectroscopy
Rubaldo, Laurent, Brunner, Alexandre, Berthoz, Jocelyn, Péré-Laperne, N., Kerlain, A., Abraham, P., Bauza, D., Reimbold, G., Gravrand, OlivierVolume:
43
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-014-3226-y
Date:
August, 2014
File:
PDF, 1.55 MB
english, 2014