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Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry
L.X. Yang, W. Steinchen, M. Schuth, G. KupferVolume:
16
Year:
1995
Language:
english
Pages:
12
DOI:
10.1016/0263-2241(95)00020-0
File:
PDF, 878 KB
english, 1995