Interface recombination velocity measurement in SiO2/Si

Interface recombination velocity measurement in SiO2/Si

Ilahi, S., Yacoubi, N.
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Volume:
48
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782614030130
Date:
March, 2014
File:
PDF, 301 KB
english, 2014
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