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Electrical properties of a SiC-Si multilayer structure
Bozhevol’nov, V. B., Yafyasov, A. M., Miailovskii, V. Yu., Egorova, Yu. V., Sokolov, A. A., Filatova, E. O.Volume:
48
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782614060074
Date:
June, 2014
File:
PDF, 515 KB
english, 2014