Analysis of the degradation of AlGaN/GaN HEMTs by...

Journal of the Korean Physical Society 2014 / 05 Vol. 64; Iss. 10

Analysis of the degradation of AlGaN/GaN HEMTs by high-temperature operation tests

Lee, Jong-Min, Min, Byoung-Gue, Ju, Cheol-Won, Ahn, Ho-Kyun, Mun, Jae-Kyoung, Lim, Jong-Won, Nam, Eunsoo
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Volume:
64
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.64.1446
Date:
May, 2014
File:
PDF, 324 KB
english, 2014
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