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Thickness dependences of the structural optical, and electrical properties of Cu2Se thin films grown by using DC magnetron sputtering
Ahn, Heejin, Um, YounghoVolume:
64
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.64.1600
Date:
May, 2014
File:
PDF, 994 KB
english, 2014