Electrical Study of Self-Assembled Ge Quantum Dots Embedded...

Solid State Phenomena 2011 / 8 Vol. 178-179

Electrical Study of Self-Assembled Ge Quantum Dots Embedded in P-Type Silicon. Temperature Dependent Capacitance Voltage and DLTS Study

Rangel-Kuoppa, Victor Tapio, Chen, Gang, Jantsch, Wolfgang
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Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.178-179.67
Date:
August, 2011
File:
PDF, 607 KB
english, 2011
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