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[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests
Chen, Jifeng, Winemberg, LeRoy, Tehranipoor, MohammadYear:
2014
Language:
english
DOI:
10.1109/vts.2014.6818782
File:
PDF, 1.40 MB
english, 2014