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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A High-Speed BE-SONOS NAND Flash Utilizing the Field-Enhancement Effect of FinFET
Hsu, Tzu-Hsuan, Lue, Hang-Ting, Lai, Erh-Kun, Hsieh, Jung-Yu, Wang, Szu-Yu, Yang, Ling-Wu, King, Ya-Chin, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-YuanYear:
2007
Language:
english
DOI:
10.1109/iedm.2007.4419100
File:
PDF, 1.84 MB
english, 2007