[IEEE 2009 IEEE MTT-S International Microwave Symposium Digest (MTT) - Boston, MA, USA (2009.06.7-2009.06.12)] 2009 IEEE MTT-S International Microwave Symposium Digest - Design and measurement of metallic post-wall waveguide components
Coenen, Teis J., Bekers, Dave J., Tauritz, Joseph L., van Vliet, Frank E.Year:
2009
Language:
english
DOI:
10.1109/mwsym.2009.5165683
File:
PDF, 745 KB
english, 2009