[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Neutron-induced latchup in SRAMs at ground level
Dodd, P.E., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L.Year:
2003
Language:
english
DOI:
10.1109/relphy.2003.1197720
File:
PDF, 367 KB
english, 2003