Characterization of plasma-enhanced atomic layer deposition...

Characterization of plasma-enhanced atomic layer deposition of Al2O3 using dimethylaluminum isopropoxide

Yang, Jialing, Eller, Brianna S., Kaur, Manpuneet, Nemanich, Robert J.
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Volume:
32
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4866378
Date:
March, 2014
File:
PDF, 1.79 MB
english, 2014
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