Auger-electron-depth profiling studies on surface layers grown by annealing Fe-Si-Al alloys in oxidizing atmospheres
Hartig, K., Pospiech, G.Volume:
19
Language:
english
Journal:
Journal of Magnetism and Magnetic Materials
DOI:
10.1016/0304-8853(80)90558-2
Date:
April, 1980
File:
PDF, 293 KB
english, 1980