Determination of the indium content and layer thicknesses in InGaN/GaN quantum wells by x-ray scattering
Vickers, M. E., Kappers, M. J., Smeeton, T. M., Thrush, E. J., Barnard, J. S., Humphreys, C. J.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1587251
File:
PDF, 467 KB
english, 2003