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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors
Martins, C. V., Semiao, J., Vazquez, J. C., Champac, V., Santos, M., Teixeira, I. C., Teixeira, J. P.Year:
2011
Language:
english
DOI:
10.1109/vts.2011.5783784
File:
PDF, 981 KB
english, 2011