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ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Review on Methods for Trench MOSFET Gate Oxide Reliability and Switching Speed Improvement
Ng, Hong SengYear:
2010
Language:
english
DOI:
10.1149/1.3360590
File:
PDF, 324 KB
english, 2010