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Quantitative analysis of atomic disorders in full-Heusler Co[sub 2]FeSi alloy thin films using x-ray diffraction with Co Kα and Cu Kα sources
Takamura, Yota, Nakane, Ryosho, Sugahara, SatoshiVolume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3350914
File:
PDF, 423 KB
english, 2010