Surface roughness scattering model for arbitrarily oriented...

Journal of Applied Physics 2011 Vol. 110; Iss. 8

Surface roughness scattering model for arbitrarily oriented silicon nanowires

Tienda-Luna, Isabel M., Ruiz, F. G., Godoy, A., Biel, B., Gámiz, F.
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Volume:
110
Year:
2011
Language:
english
DOI:
10.1063/1.3656026
File:
PDF, 1.06 MB
english, 2011
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