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Detailed analysis of defect reduction in electrowetting dielectrics through a two-layer ‘barrier’ approach
Schultz, A., Chevalliot, S., Kuiper, S., Heikenfeld, J.Volume:
534
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.03.008
Date:
May, 2013
File:
PDF, 1.89 MB
english, 2013