[IEEE 2010 International Conference on Machine Learning and...

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[IEEE 2010 International Conference on Machine Learning and Applications (ICMLA) - Washington, DC, USA (2010.12.12-2010.12.14)] 2010 Ninth International Conference on Machine Learning and Applications - Applying Permutation Tests for Assessing the Statistical Significance of Wrapper Based Feature Selection

Airola, Antti, Pahikkala, Tapio, Boberg, Jorma, Salakoski, Tapio
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Year:
2010
Language:
english
DOI:
10.1109/icmla.2010.158
File:
PDF, 404 KB
english, 2010
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