Volta Potential of Oxidized Aluminum Studied by Scanning...

Volta Potential of Oxidized Aluminum Studied by Scanning Kelvin Probe Force Microscopy

Yasakau, Kiryl A., Salak, Andrei N., Zheludkevich, Mikhail L., Ferreira, Mário G. S.
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Volume:
114
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp1011044
Date:
May, 2010
File:
PDF, 2.98 MB
english, 2010
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