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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - High speed Flash Memory and 1T-DRAM on dopant segregated Schottky barrier (DSSB) FinFET SONOS device for multi-functional SoC applications
Choi, Sung-Jin, Jin-Woo Han,, Sungho Kim,, Dong-Hyun Kim,, Moon-Gyu Jang,, Jong-Heon Yang,, Jin Soo Kim,, Kwang Hee Kim,, Gi Sung Lee,, Jae Sub Oh,, Myeong Ho Song,, Yun Chang Park,, JeoungYear:
2008
Language:
english
DOI:
10.1109/iedm.2008.4796657
File:
PDF, 1.09 MB
english, 2008