Time and Frequency Domain Characterization of Transistor...

IEEE Transactions on Electron Devices 2013 / 06 Vol. 60; Iss. 6

Time and Frequency Domain Characterization of Transistor Self-Heating

Makovejev, Sergej, Olsen, Sarah H., Kilchytska, Valeriya, Raskin, Jean-Pierre
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2259174
Date:
June, 2013
File:
PDF, 541 KB
english, 2013
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