[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Linear drain current degradations of FG-pLEDMOS transistor under different AC stress conditions
Qian, Qinsong, Sun, Weifeng, Liu, Siyang, Shi, Longxing, Su, Wei, Xu, Zhengxin, Ma, ShulangYear:
2012
Language:
english
DOI:
10.1109/ispsd.2012.6229083
File:
PDF, 633 KB
english, 2012