High-Resolution Soft X-ray Photoelectron Spectroscopic...

Journal of Physical Chemistry B 2006 / 11 Vol. 110; Iss. 46

High-Resolution Soft X-ray Photoelectron Spectroscopic Studies and Scanning Auger Microscopy Studies of the Air Oxidation of Alkylated Silicon(111) Surfaces

Webb, Lauren J., Michalak, David J., Biteen, Julie S., Brunschwig, Bruce S., Chan, Ally S. Y., Knapp, David W., Meyer, Harry M., Nemanick, Eric J., Traub, Matthew C., Lewis, Nathan S.
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Volume:
110
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp063366s
Date:
November, 2006
File:
PDF, 430 KB
english, 2006
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