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[IEEE Annual Reliability and Maintainability Symposium, 2005. - Alexandria, VA, USA (Jan. 24-27, 2005)] Annual Reliability and Maintainability Symposium, 2005. Proceedings. - Multiple failure mode and effects analysis - an approach to risk assessment of multiple failures with FMEA
Pickard, K., Muller, P., Bertsche, B.Year:
2005
Language:
english
DOI:
10.1109/rams.2005.1408405
File:
PDF, 569 KB
english, 2005