Determination of correlation length for thickness fluctuations in thin oxide and fluoride films
Tyaginov, S E, Vexler, M I, Sokolov, N S, Suturin, S M, Banshchikov, A G, Grasser, T, Meinerzhagen, BVolume:
42
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/42/11/115307
Date:
June, 2009
File:
PDF, 456 KB
english, 2009