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State Dynamics and Modeling of Tantalum Oxide Memristors
Strachan, John Paul, Torrezan, Antonio C., Miao, Feng, Pickett, Matthew D., Yang, J. Joshua, Yi, Wei, Medeiros-Ribeiro, Gilberto, Williams, R. StanleyVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2264476
Date:
July, 2013
File:
PDF, 1.40 MB
english, 2013