Simultaneous diffuse reflection infrared spectroscopy and X-ray pair distribution function measurements
Beyer, Kevin A., Zhao, Haiyan, Borkiewicz, Olaf J., Newton, Mark A., Chupas, Peter J., Chapman, Karena W.Том:
47
Мова:
english
Журнал:
Journal of Applied Crystallography
DOI:
10.1107/s1600576713028410
Date:
February, 2014
Файл:
PDF, 903 KB
english, 2014