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[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Modeling of the pH-ISFET thermal drift

Naimi, S. E., Hajji, B., Habbani, Y., Humenyuk, I., Launay, J., Temple-Boyer, P.
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Year:
2009
Language:
english
DOI:
10.1109/icm.2009.5418627
File:
PDF, 724 KB
english, 2009
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