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[IEEE 2010 5th International Conference on Future Information Technology - Busan, Korea (South) (2010.05.21-2010.05.23)] 2010 5th International Conference on Future Information Technology - McEliece/Niederreiter PKC: Sensitivity to Fault Injection
Cayrel, Pierre-Louis, Dusart, PierreYear:
2010
Language:
english
DOI:
10.1109/futuretech.2010.5482663
File:
PDF, 151 KB
english, 2010