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Carrier transit delays in nanometer-scale GaAs MESFET's
Adams, J.A., Thayne, I.G., Beaumont, S.P., Wilkinson, C.D.W., Johnson, N.P., Kean, A.H., Stanley, C.R.Volume:
14
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.215121
Date:
February, 1993
File:
PDF, 315 KB
english, 1993