[IEEE 2013 25th International Symposium on Power...

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[IEEE 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Kanazawa (2013.5.26-2013.5.30)] 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Sub-micron junction termination for 1200V class devices toward CMOS process compatibility

Seto, Kota, Takaishi, Junpei, Imaki, Hironori, Tanaka, Masahiro, Tsukuda, Masanori, Omura, Ichiro
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Year:
2013
Language:
english
DOI:
10.1109/ispsd.2013.6694441
File:
PDF, 1.14 MB
english, 2013
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