[IEEE International Electron Devices Meeting. Technical...

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[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - A high performance active pixel sensor with 0.18um CMOS color imager technology

Shou-Gwo Wuu,, Ho-Ching Chien,, Dun-Nian Yaung,, Chien-Hsien Tseng,, Wang, C.S., Chin-Kung Chang,, Yu-Kung Hsaio,
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Year:
2001
Language:
english
DOI:
10.1109/iedm.2001.979567
File:
PDF, 223 KB
english, 2001
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