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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Fault Secure Encoder and Decoder for Memory Applications
Naeimi, Helia, DeHon, AndreYear:
2007
Language:
english
DOI:
10.1109/dft.2007.54
File:
PDF, 445 KB
english, 2007