Supply Voltage Dependent On-Chip Single-Event Transient...

IEEE Transactions on Nuclear Science 2013 / 08 Vol. 60; Iss. 4

Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha Irradiation

Hofbauer, Michael, Schweiger, Kurt, Zimmermann, Horst, Giesen, Ulrich, Langner, Frank, Schmid, Ulrich, Steininger, Andreas
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2013.2245679
Date:
August, 2013
File:
PDF, 833 KB
english, 2013
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