[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Generation of SystemC/TLM code from UML/MARTE sequence diagrams for verification
Ebeid, Emad, Quaglia, Davide, Fummi, FrancoYear:
2012
Language:
english
DOI:
10.1109/DDECS.2012.6219051
File:
PDF, 681 KB
english, 2012