Evolution of substrate noise generation mechanisms with...

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications 2006 Vol. 53; Iss. 2

Evolution of substrate noise generation mechanisms with CMOS technology scaling

M. Badaroglu, P. Wambacq, G. Van Der Plas, S. Donnay, G. Gielen, H. De Man
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Volume:
53
Year:
2006
Language:
english
DOI:
10.1109/TCSI.2005.856049
File:
PDF, 1.38 MB
english, 2006
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