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[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - On the Automation of the Test Flow of Complex SoCs
Appello, D., Tancorre, V., Bernardi, P., Grosso, M., Rebaudengo, M., Reorda, M.S.Year:
2006
Language:
english
DOI:
10.1109/VTS.2006.51
File:
PDF, 375 KB
english, 2006