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[IEEE Comput. Soc First IEEE International Workshop on Electronic Design, Test and Applications '2002 - Christchurch, New Zealand (29-31 Jan. 2002)] Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 - Address and data scrambling: causes and impact on memory tests
van de Goor, A.J., Schanstra, I.Year:
2002
Language:
english
DOI:
10.1109/DELTA.2002.994601
File:
PDF, 421 KB
english, 2002