Band Alignment and Band Gap Characterization of La...

Chinese Physics Letters 2014 / 02 Vol. 31; Iss. 2

Band Alignment and Band Gap Characterization of La 2 O 3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering

Liu, Qi-Ya, Fang, Ze-Bo, Ji, Ting, Liu, Shi-Yan, Tan, Yong-Sheng, Chen, Jia-Jun, Zhu, Yan-Yan
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Volume:
31
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/31/2/027702
Date:
February, 2014
File:
PDF, 589 KB
english, 2014
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