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Ellipsometry analysis of a-Si:H solar cell structures with submicron-size textures using glass-side illumination
Yamaguchi, Shinji, Sugimoto, Yoshio, Fujiwara, HiroyukiVolume:
565
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.06.025
Date:
August, 2014
File:
PDF, 1.26 MB
english, 2014