InxAl1-xN/AlN/GaN High Electron Mobility Transistor Structures on 200 mm Diameter Si(111) Substrates with Au-Free Device Processing
Tripathy, S., Kyaw, L. M., Dolmanan, S. B., Ngoo, Y. J., Liu, Y., Bera, M. K., Singh, S. P., Tan, H. R., Bhat, T. N., Chor, E. F.Volume:
3
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.007405jss
Date:
March, 2014
File:
PDF, 1.08 MB
english, 2014