[IEEE 2014 15th Latin American Test Workshop - LATW -...

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[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory

Pereira, Evaldo Carlos Fonseca, Goncalez, Odair Lelis, Vaz, Rafael Galhardo, Federico, Claudio Antonio, Both, Thiago Hanna, Wirth, Gilson Inacio
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Year:
2014
Language:
english
DOI:
10.1109/LATW.2014.6841919
File:
PDF, 424 KB
english, 2014
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