Probing Strain in Bent Semiconductor Nanowires with Raman...

Nano Letters 2010 / 04 Vol. 10; Iss. 4

Probing Strain in Bent Semiconductor Nanowires with Raman Spectroscopy

Chen, Jianing, Conache, Gabriela, Pistol, Mats-Erik, Gray, Struan M., Borgström, Magnus T., Xu, Hongxing, Xu, H. Q., Samuelson, Lars, Håkanson, Ulf
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Volume:
10
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl904040y
Date:
April, 2010
File:
PDF, 432 KB
english, 2010
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